Please use this identifier to cite or link to this item:
http://localhost/handle/Hannan/325
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kay, Nicholas D. author. ; | en_US |
| dc.date.accessioned | 2013 | en_US |
| dc.date.accessioned | 2020-04-28T08:52:15Z | - |
| dc.date.available | 2020-04-28T08:52:15Z | - |
| dc.date.issued | 2018 | en_US |
| dc.identifier.isbn | 978-3-319-70181-3 (Print) ; | en_US |
| dc.identifier.uri | http://localhost/handle/Hannan/325 | - |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | ALMA ; | en_US |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | Maskinellt genererad post. endra kod fer fullstendighetsnive (leader/17), annars kommer manuellt gjorda endringar att fersvinna. ; | en_US |
| dc.description | en_US | |
| dc.description | Tdig ; ALMA ; | en_US |
| dc.description | Print ; Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals : A Scanning Probe Microscopy Approach / by Nicholas D. Kay. ; 9783319701813 ; | en_US |
| dc.relation.haspart | 9783319701813.pdf | en_US |
| dc.title | Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals : A Scanning Probe Microscopy Approach / by Nicholas D. Kay. | en_US |
| dc.type | Book | en_US |
| dc.classification.lc | TA418.9.N35 | en_US |
| Appears in Collections: | مهندسی مدیریت ساخت | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 9783319701813.pdf | 7.99 MB | Adobe PDF |  Preview File |
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kay, Nicholas D. author. ; | en_US |
| dc.date.accessioned | 2013 | en_US |
| dc.date.accessioned | 2020-04-28T08:52:15Z | - |
| dc.date.available | 2020-04-28T08:52:15Z | - |
| dc.date.issued | 2018 | en_US |
| dc.identifier.isbn | 978-3-319-70181-3 (Print) ; | en_US |
| dc.identifier.uri | http://localhost/handle/Hannan/325 | - |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | ALMA ; | en_US |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | Maskinellt genererad post. endra kod fer fullstendighetsnive (leader/17), annars kommer manuellt gjorda endringar att fersvinna. ; | en_US |
| dc.description | en_US | |
| dc.description | Tdig ; ALMA ; | en_US |
| dc.description | Print ; Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals : A Scanning Probe Microscopy Approach / by Nicholas D. Kay. ; 9783319701813 ; | en_US |
| dc.relation.haspart | 9783319701813.pdf | en_US |
| dc.title | Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals : A Scanning Probe Microscopy Approach / by Nicholas D. Kay. | en_US |
| dc.type | Book | en_US |
| dc.classification.lc | TA418.9.N35 | en_US |
| Appears in Collections: | مهندسی مدیریت ساخت | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 9783319701813.pdf | 7.99 MB | Adobe PDF | Preview File |
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kay, Nicholas D. author. ; | en_US |
| dc.date.accessioned | 2013 | en_US |
| dc.date.accessioned | 2020-04-28T08:52:15Z | - |
| dc.date.available | 2020-04-28T08:52:15Z | - |
| dc.date.issued | 2018 | en_US |
| dc.identifier.isbn | 978-3-319-70181-3 (Print) ; | en_US |
| dc.identifier.uri | http://localhost/handle/Hannan/325 | - |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | ALMA ; | en_US |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | Maskinellt genererad post. endra kod fer fullstendighetsnive (leader/17), annars kommer manuellt gjorda endringar att fersvinna. ; | en_US |
| dc.description | en_US | |
| dc.description | Tdig ; ALMA ; | en_US |
| dc.description | Print ; Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals : A Scanning Probe Microscopy Approach / by Nicholas D. Kay. ; 9783319701813 ; | en_US |
| dc.relation.haspart | 9783319701813.pdf | en_US |
| dc.title | Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals : A Scanning Probe Microscopy Approach / by Nicholas D. Kay. | en_US |
| dc.type | Book | en_US |
| dc.classification.lc | TA418.9.N35 | en_US |
| Appears in Collections: | مهندسی مدیریت ساخت | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 9783319701813.pdf | 7.99 MB | Adobe PDF | Preview File |