Please use this identifier to cite or link to this item:
http://localhost/handle/Hannan/302
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Carmignato, Simone. ; | en_US |
| dc.contributor.author | Dewulf, Wim. ; | en_US |
| dc.contributor.author | Leach, Richard. ; | en_US |
| dc.date.accessioned | 2013 | en_US |
| dc.date.accessioned | 2020-04-28T08:51:54Z | - |
| dc.date.available | 2020-04-28T08:51:54Z | - |
| dc.date.issued | 2018 | en_US |
| dc.identifier.isbn | 9783319595733 ; | en_US |
| dc.identifier.isbn | 9783319595719 (print) ; | en_US |
| dc.identifier.uri | http://localhost/handle/Hannan/302 | - |
| dc.description | SpringerLink (Online service) ; | en_US |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | Printed edition: ; 9783319595719. ; | en_US |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description.abstract | This bookecovers all aspects of industrialeX-Ray computed tomographye(XCT)eincluding history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students. ; | en_US |
| dc.description.statementofresponsibility | edited by Simone Carmignato, Wim Dewulf, Richard Leach. | en_US |
| dc.description.tableofcontents | Introduction -- Principles of X-ray computed tomography -- Technical concepts and components -- Processing and visualization of CT data -- Computer simulation -- Error sources -- Performance verification -- Traceability of CT dimensional measurements -- CT for non-destructive testing and materials characterization -- CT for dimensional metrology -- Other industrial applications. ; | en_US |
| dc.format.extent | V, 369 p. 273 illus. ; online resource. ; | en_US |
| dc.publisher | Springer International Publishing : | en_US |
| dc.publisher | Imprint: Springer, | en_US |
| dc.relation.haspart | 9783319595733.pdf | en_US |
| dc.subject | Materials Science | en_US |
| dc.subject | Atoms. ; | en_US |
| dc.subject | Physics. ; | en_US |
| dc.subject | Manufacturing industries. ; | en_US |
| dc.subject | Machines. ; | en_US |
| dc.subject | Tools. ; | en_US |
| dc.subject | Optical materials. ; | en_US |
| dc.subject | Electronic materials. ; | en_US |
| dc.subject | Materials Science | en_US |
| dc.subject | Characterization and Evaluation of Materials. ; | en_US |
| dc.subject | Manufacturing, Machines, Tools. ; | en_US |
| dc.subject | Optical and Electronic Materials. ; | en_US |
| dc.subject | Atomic, Molecular, Optical and Plasma Physics. ; | en_US |
| dc.title | Industrial X-Ray Computed Tomography | en_US |
| dc.type | Book | en_US |
| dc.publisher.place | Cham : | en_US |
| dc.classification.lc | TA404.6 ; | en_US |
| dc.classification.dc | 620.11 ; 23 ; | en_US |
| Appears in Collections: | مهندسی مدیریت ساخت | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 9783319595733.pdf | 15.48 MB | Adobe PDF |  Preview File |
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Carmignato, Simone. ; | en_US |
| dc.contributor.author | Dewulf, Wim. ; | en_US |
| dc.contributor.author | Leach, Richard. ; | en_US |
| dc.date.accessioned | 2013 | en_US |
| dc.date.accessioned | 2020-04-28T08:51:54Z | - |
| dc.date.available | 2020-04-28T08:51:54Z | - |
| dc.date.issued | 2018 | en_US |
| dc.identifier.isbn | 9783319595733 ; | en_US |
| dc.identifier.isbn | 9783319595719 (print) ; | en_US |
| dc.identifier.uri | http://localhost/handle/Hannan/302 | - |
| dc.description | SpringerLink (Online service) ; | en_US |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | Printed edition: ; 9783319595719. ; | en_US |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description.abstract | This bookecovers all aspects of industrialeX-Ray computed tomographye(XCT)eincluding history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students. ; | en_US |
| dc.description.statementofresponsibility | edited by Simone Carmignato, Wim Dewulf, Richard Leach. | en_US |
| dc.description.tableofcontents | Introduction -- Principles of X-ray computed tomography -- Technical concepts and components -- Processing and visualization of CT data -- Computer simulation -- Error sources -- Performance verification -- Traceability of CT dimensional measurements -- CT for non-destructive testing and materials characterization -- CT for dimensional metrology -- Other industrial applications. ; | en_US |
| dc.format.extent | V, 369 p. 273 illus. ; online resource. ; | en_US |
| dc.publisher | Springer International Publishing : | en_US |
| dc.publisher | Imprint: Springer, | en_US |
| dc.relation.haspart | 9783319595733.pdf | en_US |
| dc.subject | Materials Science | en_US |
| dc.subject | Atoms. ; | en_US |
| dc.subject | Physics. ; | en_US |
| dc.subject | Manufacturing industries. ; | en_US |
| dc.subject | Machines. ; | en_US |
| dc.subject | Tools. ; | en_US |
| dc.subject | Optical materials. ; | en_US |
| dc.subject | Electronic materials. ; | en_US |
| dc.subject | Materials Science | en_US |
| dc.subject | Characterization and Evaluation of Materials. ; | en_US |
| dc.subject | Manufacturing, Machines, Tools. ; | en_US |
| dc.subject | Optical and Electronic Materials. ; | en_US |
| dc.subject | Atomic, Molecular, Optical and Plasma Physics. ; | en_US |
| dc.title | Industrial X-Ray Computed Tomography | en_US |
| dc.type | Book | en_US |
| dc.publisher.place | Cham : | en_US |
| dc.classification.lc | TA404.6 ; | en_US |
| dc.classification.dc | 620.11 ; 23 ; | en_US |
| Appears in Collections: | مهندسی مدیریت ساخت | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 9783319595733.pdf | 15.48 MB | Adobe PDF | Preview File |
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Carmignato, Simone. ; | en_US |
| dc.contributor.author | Dewulf, Wim. ; | en_US |
| dc.contributor.author | Leach, Richard. ; | en_US |
| dc.date.accessioned | 2013 | en_US |
| dc.date.accessioned | 2020-04-28T08:51:54Z | - |
| dc.date.available | 2020-04-28T08:51:54Z | - |
| dc.date.issued | 2018 | en_US |
| dc.identifier.isbn | 9783319595733 ; | en_US |
| dc.identifier.isbn | 9783319595719 (print) ; | en_US |
| dc.identifier.uri | http://localhost/handle/Hannan/302 | - |
| dc.description | SpringerLink (Online service) ; | en_US |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | Printed edition: ; 9783319595719. ; | en_US |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description | en_US | |
| dc.description.abstract | This bookecovers all aspects of industrialeX-Ray computed tomographye(XCT)eincluding history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students. ; | en_US |
| dc.description.statementofresponsibility | edited by Simone Carmignato, Wim Dewulf, Richard Leach. | en_US |
| dc.description.tableofcontents | Introduction -- Principles of X-ray computed tomography -- Technical concepts and components -- Processing and visualization of CT data -- Computer simulation -- Error sources -- Performance verification -- Traceability of CT dimensional measurements -- CT for non-destructive testing and materials characterization -- CT for dimensional metrology -- Other industrial applications. ; | en_US |
| dc.format.extent | V, 369 p. 273 illus. ; online resource. ; | en_US |
| dc.publisher | Springer International Publishing : | en_US |
| dc.publisher | Imprint: Springer, | en_US |
| dc.relation.haspart | 9783319595733.pdf | en_US |
| dc.subject | Materials Science | en_US |
| dc.subject | Atoms. ; | en_US |
| dc.subject | Physics. ; | en_US |
| dc.subject | Manufacturing industries. ; | en_US |
| dc.subject | Machines. ; | en_US |
| dc.subject | Tools. ; | en_US |
| dc.subject | Optical materials. ; | en_US |
| dc.subject | Electronic materials. ; | en_US |
| dc.subject | Materials Science | en_US |
| dc.subject | Characterization and Evaluation of Materials. ; | en_US |
| dc.subject | Manufacturing, Machines, Tools. ; | en_US |
| dc.subject | Optical and Electronic Materials. ; | en_US |
| dc.subject | Atomic, Molecular, Optical and Plasma Physics. ; | en_US |
| dc.title | Industrial X-Ray Computed Tomography | en_US |
| dc.type | Book | en_US |
| dc.publisher.place | Cham : | en_US |
| dc.classification.lc | TA404.6 ; | en_US |
| dc.classification.dc | 620.11 ; 23 ; | en_US |
| Appears in Collections: | مهندسی مدیریت ساخت | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 9783319595733.pdf | 15.48 MB | Adobe PDF | Preview File |