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عنوان: Industrial X-Ray Computed Tomography
پدیدآورنده: Carmignato, Simone. ;;Dewulf, Wim. ;;Leach, Richard. ;
کلید واژه ها: Materials Science;Atoms. ;;Physics. ;;Manufacturing industries. ;;Machines. ;;Tools. ;;Optical materials. ;;Electronic materials. ;;Materials Science;Characterization and Evaluation of Materials. ;;Manufacturing, Machines, Tools. ;;Optical and Electronic Materials. ;;Atomic, Molecular, Optical and Plasma Physics. ;
تاریخ انتشار: 2018
محل نشر: Cham :
ناشر: Springer International Publishing :
Imprint: Springer,
چکیده: This bookecovers all aspects of industrialeX-Ray computed tomographye(XCT)eincluding history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students. ;
توضیحات : SpringerLink (Online service) ;



Printed edition: ; 9783319595719. ;


آدرس: http://localhost/handle/Hannan/302
شابک : 9783319595733 ;
9783319595719 (print) ;
اطلاعات بیشتر: V, 369 p. 273 illus. ; online resource. ;
مجموعه(های):مهندسی مدیریت ساخت

پیوست های این کاربرگه
فایل توضیحات اندازهفرمت  
9783319595733.pdf15.48 MBAdobe PDFتصویر
مشاهده فایل
عنوان: Industrial X-Ray Computed Tomography
پدیدآورنده: Carmignato, Simone. ;;Dewulf, Wim. ;;Leach, Richard. ;
کلید واژه ها: Materials Science;Atoms. ;;Physics. ;;Manufacturing industries. ;;Machines. ;;Tools. ;;Optical materials. ;;Electronic materials. ;;Materials Science;Characterization and Evaluation of Materials. ;;Manufacturing, Machines, Tools. ;;Optical and Electronic Materials. ;;Atomic, Molecular, Optical and Plasma Physics. ;
تاریخ انتشار: 2018
محل نشر: Cham :
ناشر: Springer International Publishing :
Imprint: Springer,
چکیده: This bookecovers all aspects of industrialeX-Ray computed tomographye(XCT)eincluding history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students. ;
توضیحات : SpringerLink (Online service) ;



Printed edition: ; 9783319595719. ;


آدرس: http://localhost/handle/Hannan/302
شابک : 9783319595733 ;
9783319595719 (print) ;
اطلاعات بیشتر: V, 369 p. 273 illus. ; online resource. ;
مجموعه(های):مهندسی مدیریت ساخت

پیوست های این کاربرگه
فایل توضیحات اندازهفرمت  
9783319595733.pdf15.48 MBAdobe PDFتصویر
مشاهده فایل
عنوان: Industrial X-Ray Computed Tomography
پدیدآورنده: Carmignato, Simone. ;;Dewulf, Wim. ;;Leach, Richard. ;
کلید واژه ها: Materials Science;Atoms. ;;Physics. ;;Manufacturing industries. ;;Machines. ;;Tools. ;;Optical materials. ;;Electronic materials. ;;Materials Science;Characterization and Evaluation of Materials. ;;Manufacturing, Machines, Tools. ;;Optical and Electronic Materials. ;;Atomic, Molecular, Optical and Plasma Physics. ;
تاریخ انتشار: 2018
محل نشر: Cham :
ناشر: Springer International Publishing :
Imprint: Springer,
چکیده: This bookecovers all aspects of industrialeX-Ray computed tomographye(XCT)eincluding history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students. ;
توضیحات : SpringerLink (Online service) ;



Printed edition: ; 9783319595719. ;


آدرس: http://localhost/handle/Hannan/302
شابک : 9783319595733 ;
9783319595719 (print) ;
اطلاعات بیشتر: V, 369 p. 273 illus. ; online resource. ;
مجموعه(های):مهندسی مدیریت ساخت

پیوست های این کاربرگه
فایل توضیحات اندازهفرمت  
9783319595733.pdf15.48 MBAdobe PDFتصویر
مشاهده فایل