Please use this identifier to cite or link to this item:
http://localhost/handle/Hannan/3083
| Title: | VLSI design and test. |
| Year: | 2019 |
| place: | New York, NY : |
| Publisher: | Springer Berlin Heidelberg, |
| Description: | QA76 |
| URI: | http://localhost/handle/Hannan/3083 |
| ISBN: | 9789811359491 ; |
| More Information: | pages cm ; |
| Appears in Collections: | مدیریت فناوری اطلاعات |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 9789811359491.pdf | 89.03 MB | Adobe PDF |  Preview File |
| Title: | VLSI design and test. |
| Year: | 2019 |
| place: | New York, NY : |
| Publisher: | Springer Berlin Heidelberg, |
| Description: | QA76 |
| URI: | http://localhost/handle/Hannan/3083 |
| ISBN: | 9789811359491 ; |
| More Information: | pages cm ; |
| Appears in Collections: | مدیریت فناوری اطلاعات |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 9789811359491.pdf | 89.03 MB | Adobe PDF | Preview File |
| Title: | VLSI design and test. |
| Year: | 2019 |
| place: | New York, NY : |
| Publisher: | Springer Berlin Heidelberg, |
| Description: | QA76 |
| URI: | http://localhost/handle/Hannan/3083 |
| ISBN: | 9789811359491 ; |
| More Information: | pages cm ; |
| Appears in Collections: | مدیریت فناوری اطلاعات |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 9789811359491.pdf | 89.03 MB | Adobe PDF | Preview File |