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dc.contributor.authorNakasako, Masayoshi. ; author. ;en_US
dc.date.accessioned2013en_US
dc.date.accessioned2020-04-28T08:50:36Z-
dc.date.available2020-04-28T08:50:36Z-
dc.date.issued2018en_US
dc.identifier.urihttp://localhost/handle/Hannan/232-
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionPrinted edition: ; 9784431566168 ;en_US
dc.descriptionSpringerLink (Online service) ;en_US
dc.descriptionen_US
dc.descriptionen_US
dc.description.abstractIn this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7 nm, and to a resolution of 20 nm for biological materials. Now XFEL-CXDI marks the dawn of a new era in structural analys of non-crystalline particles with dimensions larger than 100 nm, which was quite impossible in the 20th century. To conduct CXDI experiments in both synchrotron and XFEL facilities, the author has developed apparatuses, named KOTOBUKI-1 and TAKASAGO-6 for cryogenic diffraction experiments on frozen-hydrated non-crystalline particles at around 66 K. At the synchrotron facility, cryogenic diffraction experiments dramatically reduce radiation damage of specimen particles and allow tomography CXDI experiments. In addition, in XFEL experiments, non-crystalline particles scattered on thin support membranes and flash-cooled can be used to efficiently increase the rate of XFEL pulses. The rate, which depends on the number density of scattered particles and the size of X-ray beams, is currently 20-90%, probably the world record in XFEL-CXDI experiments. The experiment setups and results are introduced in this book. The author has also developed software suitable for efficiently processing of diffraction patterns and retrieving electron density maps of specimen particles based on the diffraction theory used in CXDI. ;en_US
dc.description.statementofresponsibilityby Masayoshi Nakasako.en_US
dc.description.tableofcontentsIntroduction -- X-ray diffraction -- Theory of X-ray diffraction imaging -- Diffraction apparatus for X-ray diffraction imaging -- Specimen preparation for X-ray diffraction imaging experiments at cryogenic temperature -- Processing of diffraction patterns obtained from X-ray diffraction imaging experiments using X-ray free electron laser pulses.-  Phase retrieval of diffraction patterns -- Projection structures of biological cells and organelles -- Three-dimensional structural analyses in cryogenic X-ray diffraction imaging -- Prospects for the structural analysis of biological specimens by X-ray diffraction imaging. ;en_US
dc.format.extentXX, 228 p. 96 illus., 89 illus. in color. ; online resource. ;en_US
dc.publisherSpringer Japan :en_US
dc.publisherImprint: Springer,en_US
dc.relation.ispartofseriesSpringer Series in Optical Sciences, ; 0342-4111 ; ; 210 ;en_US
dc.relation.ispartofseriesSpringer Series in Optical Sciences, ; 0342-4111 ; ; 210 ;en_US
dc.relation.haspart9784431566182.pdfen_US
dc.subjectPhysics. ;en_US
dc.subjectProteins. ;en_US
dc.subjectPhysical measurements. ;en_US
dc.subjectMeasurement. ;en_US
dc.subjectMaterials Scienceen_US
dc.subjectPhysics. ;en_US
dc.subjectOptics, Lasers, Photonics, Optical Devices. ;en_US
dc.subjectCharacterization and Evaluation of Materials. ;en_US
dc.subjectProtein Structure. ;en_US
dc.subjectCrystallography and Scattering Methods. ;en_US
dc.subjectMeasurement Science and Instrumentation. ;en_US
dc.titleX-Ray Diffraction Imaging of Biological Cellsen_US
dc.typeBooken_US
dc.publisher.placeTokyo :en_US
dc.classification.lcTA1671-1707 ;en_US
dc.classification.lcTA1501-1820 ;en_US
dc.classification.dc621.36 ; 23 ;en_US
Appears in Collections:مهندسی مدیریت ساخت

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Full metadata record
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dc.contributor.authorNakasako, Masayoshi. ; author. ;en_US
dc.date.accessioned2013en_US
dc.date.accessioned2020-04-28T08:50:36Z-
dc.date.available2020-04-28T08:50:36Z-
dc.date.issued2018en_US
dc.identifier.urihttp://localhost/handle/Hannan/232-
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionPrinted edition: ; 9784431566168 ;en_US
dc.descriptionSpringerLink (Online service) ;en_US
dc.descriptionen_US
dc.descriptionen_US
dc.description.abstractIn this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7 nm, and to a resolution of 20 nm for biological materials. Now XFEL-CXDI marks the dawn of a new era in structural analys of non-crystalline particles with dimensions larger than 100 nm, which was quite impossible in the 20th century. To conduct CXDI experiments in both synchrotron and XFEL facilities, the author has developed apparatuses, named KOTOBUKI-1 and TAKASAGO-6 for cryogenic diffraction experiments on frozen-hydrated non-crystalline particles at around 66 K. At the synchrotron facility, cryogenic diffraction experiments dramatically reduce radiation damage of specimen particles and allow tomography CXDI experiments. In addition, in XFEL experiments, non-crystalline particles scattered on thin support membranes and flash-cooled can be used to efficiently increase the rate of XFEL pulses. The rate, which depends on the number density of scattered particles and the size of X-ray beams, is currently 20-90%, probably the world record in XFEL-CXDI experiments. The experiment setups and results are introduced in this book. The author has also developed software suitable for efficiently processing of diffraction patterns and retrieving electron density maps of specimen particles based on the diffraction theory used in CXDI. ;en_US
dc.description.statementofresponsibilityby Masayoshi Nakasako.en_US
dc.description.tableofcontentsIntroduction -- X-ray diffraction -- Theory of X-ray diffraction imaging -- Diffraction apparatus for X-ray diffraction imaging -- Specimen preparation for X-ray diffraction imaging experiments at cryogenic temperature -- Processing of diffraction patterns obtained from X-ray diffraction imaging experiments using X-ray free electron laser pulses.-  Phase retrieval of diffraction patterns -- Projection structures of biological cells and organelles -- Three-dimensional structural analyses in cryogenic X-ray diffraction imaging -- Prospects for the structural analysis of biological specimens by X-ray diffraction imaging. ;en_US
dc.format.extentXX, 228 p. 96 illus., 89 illus. in color. ; online resource. ;en_US
dc.publisherSpringer Japan :en_US
dc.publisherImprint: Springer,en_US
dc.relation.ispartofseriesSpringer Series in Optical Sciences, ; 0342-4111 ; ; 210 ;en_US
dc.relation.ispartofseriesSpringer Series in Optical Sciences, ; 0342-4111 ; ; 210 ;en_US
dc.relation.haspart9784431566182.pdfen_US
dc.subjectPhysics. ;en_US
dc.subjectProteins. ;en_US
dc.subjectPhysical measurements. ;en_US
dc.subjectMeasurement. ;en_US
dc.subjectMaterials Scienceen_US
dc.subjectPhysics. ;en_US
dc.subjectOptics, Lasers, Photonics, Optical Devices. ;en_US
dc.subjectCharacterization and Evaluation of Materials. ;en_US
dc.subjectProtein Structure. ;en_US
dc.subjectCrystallography and Scattering Methods. ;en_US
dc.subjectMeasurement Science and Instrumentation. ;en_US
dc.titleX-Ray Diffraction Imaging of Biological Cellsen_US
dc.typeBooken_US
dc.publisher.placeTokyo :en_US
dc.classification.lcTA1671-1707 ;en_US
dc.classification.lcTA1501-1820 ;en_US
dc.classification.dc621.36 ; 23 ;en_US
Appears in Collections:مهندسی مدیریت ساخت

Files in This Item:
File Description SizeFormat 
9784431566182.pdf11.59 MBAdobe PDFThumbnail
Preview File
Full metadata record
DC FieldValueLanguage
dc.contributor.authorNakasako, Masayoshi. ; author. ;en_US
dc.date.accessioned2013en_US
dc.date.accessioned2020-04-28T08:50:36Z-
dc.date.available2020-04-28T08:50:36Z-
dc.date.issued2018en_US
dc.identifier.urihttp://localhost/handle/Hannan/232-
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionPrinted edition: ; 9784431566168 ;en_US
dc.descriptionSpringerLink (Online service) ;en_US
dc.descriptionen_US
dc.descriptionen_US
dc.description.abstractIn this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7 nm, and to a resolution of 20 nm for biological materials. Now XFEL-CXDI marks the dawn of a new era in structural analys of non-crystalline particles with dimensions larger than 100 nm, which was quite impossible in the 20th century. To conduct CXDI experiments in both synchrotron and XFEL facilities, the author has developed apparatuses, named KOTOBUKI-1 and TAKASAGO-6 for cryogenic diffraction experiments on frozen-hydrated non-crystalline particles at around 66 K. At the synchrotron facility, cryogenic diffraction experiments dramatically reduce radiation damage of specimen particles and allow tomography CXDI experiments. In addition, in XFEL experiments, non-crystalline particles scattered on thin support membranes and flash-cooled can be used to efficiently increase the rate of XFEL pulses. The rate, which depends on the number density of scattered particles and the size of X-ray beams, is currently 20-90%, probably the world record in XFEL-CXDI experiments. The experiment setups and results are introduced in this book. The author has also developed software suitable for efficiently processing of diffraction patterns and retrieving electron density maps of specimen particles based on the diffraction theory used in CXDI. ;en_US
dc.description.statementofresponsibilityby Masayoshi Nakasako.en_US
dc.description.tableofcontentsIntroduction -- X-ray diffraction -- Theory of X-ray diffraction imaging -- Diffraction apparatus for X-ray diffraction imaging -- Specimen preparation for X-ray diffraction imaging experiments at cryogenic temperature -- Processing of diffraction patterns obtained from X-ray diffraction imaging experiments using X-ray free electron laser pulses.-  Phase retrieval of diffraction patterns -- Projection structures of biological cells and organelles -- Three-dimensional structural analyses in cryogenic X-ray diffraction imaging -- Prospects for the structural analysis of biological specimens by X-ray diffraction imaging. ;en_US
dc.format.extentXX, 228 p. 96 illus., 89 illus. in color. ; online resource. ;en_US
dc.publisherSpringer Japan :en_US
dc.publisherImprint: Springer,en_US
dc.relation.ispartofseriesSpringer Series in Optical Sciences, ; 0342-4111 ; ; 210 ;en_US
dc.relation.ispartofseriesSpringer Series in Optical Sciences, ; 0342-4111 ; ; 210 ;en_US
dc.relation.haspart9784431566182.pdfen_US
dc.subjectPhysics. ;en_US
dc.subjectProteins. ;en_US
dc.subjectPhysical measurements. ;en_US
dc.subjectMeasurement. ;en_US
dc.subjectMaterials Scienceen_US
dc.subjectPhysics. ;en_US
dc.subjectOptics, Lasers, Photonics, Optical Devices. ;en_US
dc.subjectCharacterization and Evaluation of Materials. ;en_US
dc.subjectProtein Structure. ;en_US
dc.subjectCrystallography and Scattering Methods. ;en_US
dc.subjectMeasurement Science and Instrumentation. ;en_US
dc.titleX-Ray Diffraction Imaging of Biological Cellsen_US
dc.typeBooken_US
dc.publisher.placeTokyo :en_US
dc.classification.lcTA1671-1707 ;en_US
dc.classification.lcTA1501-1820 ;en_US
dc.classification.dc621.36 ; 23 ;en_US
Appears in Collections:مهندسی مدیریت ساخت

Files in This Item:
File Description SizeFormat 
9784431566182.pdf11.59 MBAdobe PDFThumbnail
Preview File