Please use this identifier to cite or link to this item: http://localhost/handle/Hannan/2234
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dc.date.accessioned2013en_US
dc.date.accessioned2020-05-17T08:36:27Z-
dc.date.available2020-05-17T08:36:27Z-
dc.date.issued2018en_US
dc.identifier.isbn978-3-319-69053-7 (Print) ;en_US
dc.identifier.urihttp://localhost/handle/Hannan/2234-
dc.descriptionen_US
dc.descriptionALMA ;en_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionQA76en_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionMaskinellt genererad post. endra kod fer fullstendighetsnive (leader/17), annars kommer manuellt gjorda endringar att fersvinna. ;en_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionTdig ; ALMA ;en_US
dc.descriptionPrint ; Phase Change Memory : Device Physics, Reliability and Applications / edited by Andrea Redaeen_US
dc.relation.haspart9783319690537.pdfen_US
dc.titlePhase Change Memory : Device Physics, Reliability and Applications / edited by Andrea Redaelli.en_US
dc.typeBooken_US
Appears in Collections:مهندسی فناوری اطلاعات

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Full metadata record
DC FieldValueLanguage
dc.date.accessioned2013en_US
dc.date.accessioned2020-05-17T08:36:27Z-
dc.date.available2020-05-17T08:36:27Z-
dc.date.issued2018en_US
dc.identifier.isbn978-3-319-69053-7 (Print) ;en_US
dc.identifier.urihttp://localhost/handle/Hannan/2234-
dc.descriptionen_US
dc.descriptionALMA ;en_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionQA76en_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionMaskinellt genererad post. endra kod fer fullstendighetsnive (leader/17), annars kommer manuellt gjorda endringar att fersvinna. ;en_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionTdig ; ALMA ;en_US
dc.descriptionPrint ; Phase Change Memory : Device Physics, Reliability and Applications / edited by Andrea Redaeen_US
dc.relation.haspart9783319690537.pdfen_US
dc.titlePhase Change Memory : Device Physics, Reliability and Applications / edited by Andrea Redaelli.en_US
dc.typeBooken_US
Appears in Collections:مهندسی فناوری اطلاعات

Files in This Item:
File Description SizeFormat 
9783319690537.pdf15.57 MBAdobe PDFThumbnail
Preview File
Full metadata record
DC FieldValueLanguage
dc.date.accessioned2013en_US
dc.date.accessioned2020-05-17T08:36:27Z-
dc.date.available2020-05-17T08:36:27Z-
dc.date.issued2018en_US
dc.identifier.isbn978-3-319-69053-7 (Print) ;en_US
dc.identifier.urihttp://localhost/handle/Hannan/2234-
dc.descriptionen_US
dc.descriptionALMA ;en_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionQA76en_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionMaskinellt genererad post. endra kod fer fullstendighetsnive (leader/17), annars kommer manuellt gjorda endringar att fersvinna. ;en_US
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionTdig ; ALMA ;en_US
dc.descriptionPrint ; Phase Change Memory : Device Physics, Reliability and Applications / edited by Andrea Redaeen_US
dc.relation.haspart9783319690537.pdfen_US
dc.titlePhase Change Memory : Device Physics, Reliability and Applications / edited by Andrea Redaelli.en_US
dc.typeBooken_US
Appears in Collections:مهندسی فناوری اطلاعات

Files in This Item:
File Description SizeFormat 
9783319690537.pdf15.57 MBAdobe PDFThumbnail
Preview File